Scanning Electron Microscope (SEM)

High-resolution imaging using focused electron beam scanning

Models (10)

FlexSEM 1000 II

Hitachi High-Tech

The Hitachi FlexSEM 1000 II is a compact variable-pressure scanning electron microscope that delivers the performance of a conventional SEM in a lab-friendly, tabletop footprint. Achieves 4.0 nm resolution with thermionic electron source. Features an Ultra-Variable-Pressure Detector (UVD) for imaging non-conductive specimens without metal coating, intuitive auto functions (AFC, ABCC), and SEM MAP camera navigation. Operates on standard wall outlet power.

Hitachi SU7000

Hitachi High-Tech

Ultra-high resolution Schottky FE-SEM with advanced analytical capabilities

$500K - $700K

JEOL JCM-7000 NeoScope

JEOL

Benchtop Scanning Electron Microscope designed for accessibility and ease of operation. The NeoScope incorporates advanced technology allowing users at any skill level to obtain high-quality SEM images and elemental analysis results within minutes. Ideal for quality control, education, and routine analytical applications.

JEOL JSM-IT210

JEOL

Compact InTouchScope Scanning Electron Microscope incorporating intelligent automation and ease-of-use features. Features Zeromag optical-to-SEM navigation, Live EDS analysis capabilities, real-time 3D surface reconstruction, and automated montage imaging. Available in high vacuum and low vacuum configurations.

JEOL JSM-IT510

JEOL

InTouchScope SEM with intuitive touchscreen operation for routine and advanced analysis

$150K - $250K

JEOL JSM-IT710HR

JEOL

High-resolution field emission SEM with large chamber for versatile materials characterization

$350K - $500K

JEOL JSM-IT810

JEOL

Ultrahigh resolution Schottky Field Emission Scanning Electron Microscope featuring advanced high-resolution analytical technology. The JSM-IT810 delivers exceptional imaging performance with sub-nanometer resolution, comprehensive EDS and EELS capabilities, and automated alignment functions for materials characterization and nanotechnology research.

SU3800

Hitachi High-Tech

The Hitachi SU3800 is a variable-pressure scanning electron microscope delivering both operability and expandability. Features 3.0 nm secondary electron resolution at 30 kV, accelerating voltage range of 0.3-30 kV, low vacuum mode (6-650 Pa), and maximum specimen size of 200mm diameter. Includes automated functions (AFS, ABCC, AFC, ASC), SEM MAP navigation, and supports a wide range of detectors including secondary electron, backscattered electron, and ultra-sensitive low vacuum detector (UVD).

ZEISS GeminiSEM 560

Carl Zeiss

Ultra-high resolution FE-SEM with Gemini 2 column for nanoscale imaging and analysis

$600K - $900K

ZEISS Sigma 300

Carl Zeiss

Field emission SEM based on Gemini technology for materials science and life sciences

$300K - $450K

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Scanning Electron Microscope (SEM)

Models (10)

FlexSEM 1000 II

Hitachi SU7000

JEOL JCM-7000 NeoScope

JEOL JSM-IT210

JEOL JSM-IT510

JEOL JSM-IT710HR

JEOL JSM-IT810

SU3800

ZEISS GeminiSEM 560

ZEISS Sigma 300

Scanning Electron Microscope (SEM)

Models (10)

FlexSEM 1000 II

Hitachi SU7000

JEOL JCM-7000 NeoScope

JEOL JSM-IT210

JEOL JSM-IT510

JEOL JSM-IT710HR

JEOL JSM-IT810

SU3800

ZEISS GeminiSEM 560

ZEISS Sigma 300