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High-resolution field emission SEM with large chamber for versatile materials characterization
| Resolution Spec | 0.8 nm at 15 kV |
| Magnification | 10x to 1,000,000x |
| Specimen Stage | 5-axis motorized |
| Acceleration Voltage | 0.01-30 kV |
| Data Interoperability | Moderate data interoperability through InTouchScope software. Standard image format exports. |
| Supported Formats | TIFF, JPEG, BMP, and native JEOL format |
| Software Requirements | Requires JEOL InTouchScope software. |
| Notes | High-resolution SEM. Standard image export capabilities. |