FlexSEM 1000 II

The Hitachi FlexSEM 1000 II is a compact variable-pressure scanning electron microscope that delivers the performance of a conventional SEM in a lab-friendly, tabletop footprint. Achieves 4.0 nm resolution with thermionic electron source. Features an Ultra-Variable-Pressure Detector (UVD) for imaging non-conductive specimens without metal coating, intuitive auto functions (AFC, ABCC), and SEM MAP camera navigation. Operates on standard wall outlet power.