Search for equipment
The Hitachi SU3800 is a variable-pressure scanning electron microscope delivering both operability and expandability. Features 3.0 nm secondary electron resolution at 30 kV, accelerating voltage range of 0.3-30 kV, low vacuum mode (6-650 Pa), and maximum specimen size of 200mm diameter. Includes automated functions (AFS, ABCC, AFC, ASC), SEM MAP navigation, and supports a wide range of detectors including secondary electron, backscattered electron, and ultra-sensitive low vacuum detector (UVD).