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Benchtop X-ray diffractometer for phase identification and quantitative analysis
| X-Ray Source * | 600 W Cu |
| Detector | D/teX Ultra |
| Footprint | benchtop |
| Configuration | theta-2theta |
| Data Interoperability | Benchtop X-ray diffractometer with SmartLab Studio II software. Standard XRD formats enable database searching and third-party analysis. |
| Supported Formats | RAW, ASCII, and JCPDS/ICDD compatible formats |
| Software Requirements | SmartLab Studio II software required for operation |
| Notes | Entry-level XRD with standard format support. Compatible with ICDD PDF database and third-party analysis software. |