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The Bruker D8 DISCOVER is a flagship multipurpose X-ray diffractometer designed for structural characterization of materials ranging from powders and amorphous materials to epitaxial multi-layered thin films. It features high-brilliance X-ray sources including the IµS microfocus source with MONTEL optics, delivering highly brilliant beams for micro X-ray diffraction. The system supports samples up to 300mm diameter and 50kg weight with its Universal Motion Concept (UMC) stages. Key applications include thin film analysis (GID, XRR, HRXRD), materials research, high-throughput screening, residual stress analysis, texture analysis, SAXS/WAXS, and pair distribution function (PDF) analysis. The DAVINCI.DESIGN enables tool-free and alignment-free configuration changes.