HF5000

The Hitachi HF5000 is a 200 kV aberration-corrected field emission TEM/STEM offering sub-Angstrom imaging and analysis. Features 0.078 nm STEM resolution and 0.102 nm TEM resolution, cold field emission electron source, Hitachi fully automated probe-forming spherical aberration corrector, and symmetrically opposed dual 100 mm2 SDD EDX detectors. Enables simultaneous Cs-corrected SEM and STEM imaging with atomic resolution for advanced materials characterization.